Researchers from Berkeley Lab, Helmholtz-Zentrum Hereon, the Helmut Schmidt University, and the Helmholtz-Zentrum Berlin have developed a promising approach for detecting voltage changes on the surface of photoelectrodes using a newly developed automated data analysis method. The method, presented in the journal PRX Energy, enables so-called “Kelvin Probe Force Microscopy (KPFM)” measurements in the millisecond range. It works by extracting information contained in each pixel of a KPFM image, which was previously not possible. The knowledge gained in this way can contribute to the development of more efficient and stable materials for photoelectrochemical cells.